|Table of Contents|

Evaluation of Resistance of Soybean Germplasm to Common Cutworm Based on Three Resistance Mechanisms(PDF)

《大豆科学》[ISSN:1000-9841/CN:23-1227/S]

Issue:
2011年01期
Page:
8-14
Research Field:
Publishing date:

Info

Title:
Evaluation of Resistance of Soybean Germplasm to Common Cutworm Based on Three Resistance Mechanisms
Author(s):
WANG Hui GAO Zhong-jie FAN Rui ZHANG Yin-shan WU Qian YU De-yue
National Key Laboratory of Crop Genetics and Germplasm Enhancement; National Center for Soybean Improvement, Ministry of Agriculture; Soybean Research Institute, Nanjing Agricultural University,Nanjing 210095, Jiangsu,China
Keywords:
Soybean Common cutworm Antibiosis Antixenosis Tolerance
PACS:
S565.1
DOI:
10.11861/j.issn.1000-9841.2011.01.0008
Abstract:
The common cutworm is a major pest of soybean in the southern China. In this study, the insect bioassay was applied to evaluate the resistance of 194 soybean cultivars. Agronomic traits were measured after the leaf-feeding test and sampled at V6 growth stage and after the harvest, respectively. In the insect bioassay, there were 77 resistant soybean cultivars based on the antibiosis and 107 resistant soybean cultivars based on the antixenosis. In the tolerance test, the 194 soybean cultivars performed different tolerance. The correlation analysis was used to analyze the relationship of the three resistance mechanisms. The result showed that the antibiosis had extremely significant positive correlation with the antixenosis. However, neither the antibiosis nor antixenosis had significant positive correlation with the tolerance. Based on the resistant test, twenty-five elite soybean resistance germplasms were selected, which could be used as new resistant sources in soybean genetics and breeding.

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Last Update: 2014-09-11