|Table of Contents|

Counting of Overlapping Soybean Grain by Support Vector Machine(PDF)

《大豆科学》[ISSN:1000-9841/CN:23-1227/S]

Issue:
2009年01期
Page:
151-155
Research Field:
Publishing date:

Info

Title:
Counting of Overlapping Soybean Grain by Support Vector Machine
Author(s):
ZHU Wei-xingSU WeiZHANG Huai-de
Electrical and Information Engineering College,Jiangsu University,Zhenjiang 212013,Jiangsu,China
Keywords:
Support Vector MachineSegmentCountSoybean
PACS:
TP391.41
DOI:
10.11861/j.issn.1000-9841.2009.01.0151
Abstract:
In order to improve the efficiency and precision for measuring the mass of 1 000 soybean grains,a novel new method which can effectively segment overlapping granule and count it based on the machine vision technique was proposed.Firstly collecting the products grain image and be preprocessed,then distilling the region of all overlapping grain;The concave points,grains’ approximate center of area and the euler number of topology shape were found out as the feature vectors of the overlapping area;the types of overlapping particle intellectively were finally identified into serial,parallel and double-deck overlapping types by the classification of Support Vector Machine,and automatically divided overlapping granule into lots of single grains.The experimental results show that the paper can effectively count the double-deck overlapping or profoundly cohesive soybean grains.

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Last Update: 2014-10-03